• DocumentCode
    1540672
  • Title

    Bi(2223) Ag sheathed tape Ic and exponent n characterization and modelling under DC applied magnetic field

  • Author

    Dutoit, B. ; Sjostrom, M. ; Stavrev, S.

  • Author_Institution
    EPFL-DE-CIRC, Fed. Inst. of Technol., Lausanne, Switzerland
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    809
  • Lastpage
    812
  • Abstract
    We use a dual channel digital lock-in to perform electrical measurement of AC losses at power frequencies. A DC magnetic field between 2 and 400 mT is applied with a varying angle from parallel to perpendicular to the tape surface, thus having a complete view of the loss behavior under DC applied field. Furthermore, the same experimental layout is used to acquire time series of current and voltage across the sample. Using a triangular input current, we measure and average the voltage, which then is fitted to a power law (I/I/sub c/)/sup 11/. The measurements are repeated for the mentioned magnetic field and angle domain to give the dependencies of I/sub c/ and n with magnetic field and angle. For device modeling purposes, we can then express a phenomenological law giving I/sub c/ and n as a function of the applied magnetic field´s intensity and direction.
  • Keywords
    bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; loss measurement; magnetic fields; silver; strontium compounds; superconducting tapes; 2 to 400 mT; AC losses measurement; Bi(2223) Ag sheathed tape; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag tape; DC applied magnetic field; DC magnetic field; angle domain; device modeling purposes; dual channel digital lock-in; electrical measurement; exponent n characterization; loss behavior; magnetic field; modelling; parallel magnetic field; perpendicular magnetic fields; tape surface; triangular input current; Current measurement; Electric variables measurement; Frequency; Integrated circuit modeling; Loss measurement; Magnetic field measurement; Magnetic fields; Phase measurement; Power measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783420
  • Filename
    783420