DocumentCode :
1540672
Title :
Bi(2223) Ag sheathed tape Ic and exponent n characterization and modelling under DC applied magnetic field
Author :
Dutoit, B. ; Sjostrom, M. ; Stavrev, S.
Author_Institution :
EPFL-DE-CIRC, Fed. Inst. of Technol., Lausanne, Switzerland
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
809
Lastpage :
812
Abstract :
We use a dual channel digital lock-in to perform electrical measurement of AC losses at power frequencies. A DC magnetic field between 2 and 400 mT is applied with a varying angle from parallel to perpendicular to the tape surface, thus having a complete view of the loss behavior under DC applied field. Furthermore, the same experimental layout is used to acquire time series of current and voltage across the sample. Using a triangular input current, we measure and average the voltage, which then is fitted to a power law (I/I/sub c/)/sup 11/. The measurements are repeated for the mentioned magnetic field and angle domain to give the dependencies of I/sub c/ and n with magnetic field and angle. For device modeling purposes, we can then express a phenomenological law giving I/sub c/ and n as a function of the applied magnetic field´s intensity and direction.
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; loss measurement; magnetic fields; silver; strontium compounds; superconducting tapes; 2 to 400 mT; AC losses measurement; Bi(2223) Ag sheathed tape; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag tape; DC applied magnetic field; DC magnetic field; angle domain; device modeling purposes; dual channel digital lock-in; electrical measurement; exponent n characterization; loss behavior; magnetic field; modelling; parallel magnetic field; perpendicular magnetic fields; tape surface; triangular input current; Current measurement; Electric variables measurement; Frequency; Integrated circuit modeling; Loss measurement; Magnetic field measurement; Magnetic fields; Phase measurement; Power measurement; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783420
Filename :
783420
Link To Document :
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