• DocumentCode
    1540726
  • Title

    High-T/sub c/ DC-SQUID system for nondestructive evaluation

  • Author

    Schmidl, F. ; Wunderlich, S. ; Dorrer, L. ; Specht, H. ; Linzen, S. ; Schneidewind, I. ; Seidel, P.

  • Author_Institution
    Inst. fur Festkorperphys., Friedrich-Schiller-Univ., Jena, Germany
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    2756
  • Lastpage
    2759
  • Abstract
    We developed different types of thin film high temperature superconductor (high-T/sub c/) DC-SQUID magnetometers and gradiometers for application in a nondestructive testing system. We used these sensors in a liquid nitrogen dewar mounted above a computer controlled x-y table within a compact /spl mu/-metal shielded chamber. The planar galvanically coupled gradiometers based on step-edge or bicrystal Josephson junctions were investigated in shielded and unshielded environment. We discuss the influence of junction type and SQUID parameters depending on the device geometry on the sensitivity of our complete testing system. Our interest is focused in particular on the noise properties and magnetic field resolution at 77 K. Measurements of ac and dc current distributions will be shown as well as measurements of magnetic moments of different samples.
  • Keywords
    Josephson effect; SQUID magnetometers; current distribution; high-temperature superconductors; nondestructive testing; remanence; superconducting device noise; 77 K; DC-SQUID system; SQUID parameters; bicrystal Josephson junctions; compact /spl mu/-metal shielded chamber; computer controlled x-y table; current distributions; device geometry; high temperature superconductor; junction type; magnetic moments; magnetometers; noise properties; nondestructive evaluation; planar galvanically coupled gradiometers; step-edge Josephson junctions; Application software; Current measurement; High temperature superconductors; Magnetic field measurement; Magnetic sensors; Magnetometers; Noise measurement; Nondestructive testing; Particle measurements; Superconducting thin films;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.621808
  • Filename
    621808