• DocumentCode
    1540789
  • Title

    Statistical analysis of cavity RF faults

  • Author

    Benesch, J.F.

  • Author_Institution
    Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    888
  • Lastpage
    891
  • Abstract
    During commissioning of the CEBAF accelerator, it was found that cavities could not be operated reliably at the gradients achieved for short periods during individual cavity commissioning. The principal hypothesis for the cause of about two thirds the faults seen is charging of the cold ceramic RF window, which is 7.6 cm off the beam axis. Beginning in February 1995, most RF systems faults were automatically logged. Simple statistical analysis of the accumulated fault data was first applied in July 1995, with a substantial drop in fault rate recorded. The intent of the analysis was to predict the gradient for each cavity at which it would fault once every ten days, leading to a fault rate for the machine of about 33/day (330 cavities). This analysis method was pursued through July 1996 with substantial benefit. Cavity gradients were increased thereafter to obtain information for an upgrade to 6 GeV, with concomitant fault rate increases. In late 1996 and early 1997, in situ helium discharge processing was employed in 88 cavities to reduce field emission. The methods used for the analysis of 30000+ faults recorded between February 1995 and December 1997 are presented. Comparisons of performance before and after helium processing are presented.
  • Keywords
    accelerator RF systems; accelerator cavities; accelerator magnets; electrical faults; statistical analysis; superconducting magnets; 6 GeV; 7.6 cm; CEBAF accelerator; accelerator cavity RF faults; accelerator superconducting magnets; cavity gradients; cold ceramic RF window charging; commissioning; statistical analysis; Ceramics; Energy measurement; Life estimation; Manufacturing; Physics; Probes; Radio frequency; Statistical analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783439
  • Filename
    783439