Study of the surface resistance of niobium sputter-coated copper cavities

A systematic study of the superconducting properties of niobium films deposited on the inner wall of copper radiofrequency cavities is presented. Films are grown by sputtering with different discharge gases (Xe, Kr, Ar and Ar/Ne mixtures) on substrates prepared under different conditions. The measured quantities include the surface resistance at 1.5 GHz, the critical temperature and the penetration depth. The surface resistance is analyzed in terms of its dependence on temperature, RF field and the density of trapped fluxons. Once allowance for electron scattering is made by means of a single mean free path parameter, good agreement with BCS theory is observed. The residual resistance is observed to be essentially noncorrelated with the superconducting properties, although influenced by specific coating conditions. On occasions, very low residual resistances, in the nano-ohm range, have been maintained over a broad range of RF field, indicating the absence of fundamental limitations specific to the film technology in practical applications.