DocumentCode :
1540882
Title :
Verification of the short-circuit current making capability of high-voltage switching devices
Author :
Smeets, René Peter Paul ; Van der Linden, Wim A.
Author_Institution :
KEMA High Power Lab., Arnhem, Netherlands
Volume :
16
Issue :
4
fYear :
2001
fDate :
10/1/2001 12:00:00 AM
Firstpage :
611
Lastpage :
618
Abstract :
Switching-in of short-circuit current leads to pre-arcing in the switching device. Pre-arcing affects the ability of switchgear to close and latch. In three-phase systems, making is associated with transient voltage phenomena that may have a significant impact on the duration of the pre-arcing period. An analysis is presented of these transients. It was found that pre-arcing times in three-phase systems can be considerably prolonged with respect to a single phase situation. On the other hand, it is demonstrated that the three-phase interaction has a moderating influence on the peak value of asymmetrical current. A test-circuit is described, able to perform three-phase synthetic make tests up to 245 kV at current up to 63 kA, representing all transient phenomena. Specific tests are described requiring the maximum available laboratory power: one with a circuit breaker subjected to direct test and one with a high-speed grounding switch subjected to synthetic tests
Keywords :
arcs (electric); short-circuit currents; switchgear testing; transient analysis; 245 kV; 63 kA; arc discharges; asymmetrical current; circuit breaker; circuit breaker testing; circuit transient analysis; high-speed grounding switch; high-voltage switching devices; pre-arcing; pre-arcing times; short-circuit current making capability; single phase situation; test-circuit; three-phase synthetic make tests; three-phase systems; transient phenomena; transient voltage phenomena; Circuit breakers; Circuit testing; Grounding; Laboratories; Latches; Performance evaluation; Switches; Switchgear; Transient analysis; Voltage;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/61.956746
Filename :
956746
Link To Document :
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