• DocumentCode
    1541007
  • Title

    Microstrip disk resonators for filters fabricated from TBCCO thin films

  • Author

    Jenkins, A.P. ; Kale, K.S. ; Edwards, D.J. ; Dew-Hughes, D. ; Bramley, A.P. ; Grovenor, C.R.M. ; Kale, S.V.

  • Author_Institution
    Dept. of Eng. Sci., Oxford Univ., UK
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    2793
  • Lastpage
    2796
  • Abstract
    Microstrip disk type resonators have been designed and tested. These have been fabricated from TBCCO 2212 thin films deposited by DC sputtering onto 2 cm square LaAlO/sub 3/ substrates. The R/sub s/ of such large area films has been measured at 40 GHz using a copper end wall replacement cavity and shown to be less than 200 /spl mu//spl Omega/ scaled to 10 GHz and at 80 K. Q values of 2 to 6 GHz disk resonators have demonstrated considerable improvements when compared to both linear HTS microstrip resonators and comparable copper disk resonators. Additionally, preliminary results for the performance of such disk resonators as a function of microwave power will be presented for application in high power filters.
  • Keywords
    Q-factor; barium compounds; calcium compounds; electron device manufacture; high-temperature superconductors; microstrip filters; microstrip resonators; microwave filters; power filters; resonator filters; sputtered coatings; superconducting microwave devices; superconducting resonators; superconducting thin films; thallium compounds; 2 to 40 GHz; 80 K; DC sputtering; HTS; LaAlO/sub 3/; LaAlO/sub 3/ substrate; Q value; TBCCO thin film; Tl/sub 2/Ba/sub 2/CaCu/sub 2/O; cavity end wall replacement; fabrication; microstrip disk resonator; microwave power filter; surface resistance; Area measurement; Copper; High temperature superconductors; Microstrip filters; Microstrip resonators; Power filters; Q measurement; Resonator filters; Sputtering; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.621817
  • Filename
    621817