DocumentCode
1541432
Title
Conference Reports
Author
Kapur, Rohit
Author_Institution
Synopsys
Volume
27
Issue
4
fYear
2010
Firstpage
77
Lastpage
77
Abstract
Design and Test Conference Reports, July/August 2010
Keywords
Design and Test Conference Reports;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.82
Filename
5512530
Link To Document