• DocumentCode
    1541511
  • Title

    Measurement of critical current and transient characteristics of a high-temperature superconductor tube with a pulsed current supply

  • Author

    Cha, Y.S. ; Evans, D.J. ; Hull, J.R.

  • Author_Institution
    Argonne Nat. Lab., IL, USA
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    1320
  • Lastpage
    1323
  • Abstract
    The transient response of a melt-cast-processed BSCCO-2212 superconductor tube was investigated by using a pulsed current supply, it was found that (a) the maximum induced current and the excitation current at field penetration increase with the maximum excitation current, and (b) there is a time delay between peak excitation current and peak magnetic field inside the superconductor. These observations can be explained by magnetic diffusion. The AC steady-state critical current of the superconductor was found to compare favorably with that of the pulsed current test when the excitation current is relatively low, but it falls below that of the pulsed current test when the excitation current is relatively high.
  • Keywords
    critical current density (superconductivity); electric current measurement; fault current limiters; high-temperature superconductors; superconducting devices; transient response; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O; critical current measurment; excitation current; high-temperature superconductor tube; inductive fault current limiter; magnetic diffusion; maximum excitation current; maximum induced current; melt-cast-processed BSCCO-2212 superconductor tube; peak excitation current; peak magnetic field; pulsed current supply; pulsed current test; superconductor; time delay; transient characteristics; transient response; Critical current; Current measurement; Current supplies; Delay effects; Magnetic field measurement; Magnetic fields; Steady-state; Superconducting magnets; Testing; Transient response;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783545
  • Filename
    783545