• DocumentCode
    1541612
  • Title

    A Low Noise Pixel Architecture for Scientific CMOS Monolithic Active Pixel Sensors

  • Author

    Coath, Rebecca E. ; Crooks, Jamie P. ; Godbeer, Adam ; Wilson, Matthew D. ; Zhang, Zhige ; Stanitzki, Marcel ; Tyndel, Mike ; Turchetta, Renato A D

  • Author_Institution
    Sci. & Technol. Facilities Council, Rutherford Appleton Lab., Didcot, UK
  • Volume
    57
  • Issue
    5
  • fYear
    2010
  • Firstpage
    2490
  • Lastpage
    2496
  • Abstract
    This paper presents the design and characterisation of FORTIS (4T Test Image Sensor), which is a low noise, CMOS monolithic active pixel sensor for scientific applications. The pixels present in FORTIS are based around the four transistor (4T) pixel architecture, which is already widely used in the commercial imaging community. The sensor design contains thirteen different variants of the 4T pixel architecture to investigate the effects of changing its core parameters. The variants include differences in the pixel pitch, the diode size, the in-pixel source follower, and the capacitance of the floating diffusion node (the input node of the in-pixel source follower). Processing variations have also been studied, which include varying the resistivity of the epitaxial layer and investigating the effects of a special deep p-well layer. By varying these parameters, the 4T pixel architecture can be optimised for scientific applications where detection of small amounts of charge is required.
  • Keywords
    CMOS image sensors; epitaxial layers; 4T test image sensor; FORTIS; commercial imaging; diode size; epitaxial layer; floating diffusion node; in-pixel source follower; low noise pixel architecture; p-well layer; pixel pitch; scientific CMOS monolithic active pixel sensors; Active noise reduction; CMOS image sensors; Capacitance; Conductivity; Diodes; Epitaxial layers; Image sensors; Pixel; Sensor phenomena and characterization; Testing; 4T pixel; CMOS image sensors; active pixel sensors; high resistivity epitaxial layer; image sensors; low noise image sensor; pinned photodiode; radiation hardness; random telegraph signal noise;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2052469
  • Filename
    5512562