• DocumentCode
    1541910
  • Title

    Magnetic field and microwave effects on critical current fluctuations in HTS grain-boundary Josephson junctions

  • Author

    Ling Hao ; Macfarlane, J.C. ; Pegrum, C.M. ; Sloggett, G.J. ; Foley, C.P.

  • Author_Institution
    Dept. of Phys. & Appl. Phys., Strathclyde Univ., Glasgow, UK
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    2840
  • Lastpage
    2843
  • Abstract
    The excess noise levels in HTS grain boundary Josephson junctions, when expressed as critical current fluctuations |/spl delta/I/sub c/|, vary linearly with I/sub c/ as the temperature changes. By contrast, when the critical current is suppressed by an external magnetic field, the measured fluctuations |/spl delta/I/sub c/| remain nearly constant while L itself undergoes order-of-magnitude changes. This effect, which does not seem to have been widely recognized, is examined with respect to the spatial modulation of the critical current density within the junction. Calculations based on this model are in good agreement with our experimental measurements. In related studies, we measure the excess noise levels between Shapiro steps in a microwave-irradiated junction, and find them to agree with a modified version of the Likharev-Semenov equation for thermal noise.
  • Keywords
    Josephson effect; critical current density (superconductivity); current fluctuations; fluctuations in superconductors; grain boundaries; high-temperature superconductors; superconducting device noise; thermal noise; HTS; Likharev-Semenov equation; Shapiro steps; critical current fluctuations; grain-boundary Josephson junction; magnetic field; microwave irradiation; thermal noise; Critical current; Critical current density; Current measurement; Fluctuations; Grain boundaries; High temperature superconductors; Josephson junctions; Magnetic field measurement; Microwave measurements; Noise level;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.621873
  • Filename
    621873