DocumentCode :
1542129
Title :
Magnetic field behavior of SNS edge Josephson junctions
Author :
Bulman, J.B.
Author_Institution :
Loyola Marymount Univ., Los Angeles, CA, USA
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
3149
Lastpage :
3152
Abstract :
Measurements of the response of critical current of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub (3-x)/(Ga)/sub x/O/sub 7-/spl delta///YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// SNS edge Josephson junctions to external magnetic field reveal periodic dependence of critical current on magnetic field. Theoretically the shape of critical current versus magnetic field for uniform current flow across the junction should resemble a Fraunhofer diffraction pattern. Using analysis of depth of modulation as an indication of how well the experimental modulation pattern fits the diffraction model, our experiments show a correlation between the depth of modulation and the type of junction. RSJ-like I-V curves, with their sharp concave upward curvature and I/sub ex//I/sub c/<1, correlated with larger depth of modulation than flux flow-like I-V curves with their rounded concave downward curvature and I/sub ex//I/sub c/>1. Also the response of single junctions as a function of temperature is analyzed.
Keywords :
Josephson effect; barium compounds; critical current density (superconductivity); flux flow; high-temperature superconductors; praseodymium compounds; superconducting thin films; superconductor-normal-superconductor devices; yttrium compounds; Fraunhofer diffraction pattern; RSJ-like I-V curves; SNS edge Josephson junctions; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub (3-x)/(Ga)/sub x/O/sub 7-/spl delta///YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/-PrBa/sub 2/Cu/sub 3/GaO/sub 7/-YBa/sub 2/Cu/sub 3/O/sub 7/; concave upward curvature; critical current; depth of modulation; external magnetic field; flux flow-like I-V curves; modulation pattern; periodic dependence; rounded concave downward curvature; uniform current flow; Critical current; Current measurement; Diffraction; Josephson junctions; Magnetic analysis; Magnetic field measurement; Magnetic fields; Pattern analysis; Shape; Temperature;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783697
Filename :
783697
Link To Document :
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