DocumentCode :
1542276
Title :
A 10 GHz digital amplifier in an ultra-small-spread high-J/sub c/ Nb/Al-AlOx/Nb integrated circuit process
Author :
Bhat, A. ; Xiaofan Meng ; Whiteley, S. ; Jeffery, M. ; Van Duzer, T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
3232
Lastpage :
3235
Abstract :
We describe a Josephson amplifier fabricated in a high-J/sub c/ process, which is operational to speeds of at least 10 GHz, the highest reported for a voltage-state amplifier. The amplifier converts /spl sim/200 /spl mu/V digital signals to /spl sim/5 mV at 10 GHz and could be used as an interface between two superconducting systems. The bit-error-rate of the circuit was /spl sim/5/spl times/10/sup -12/ at 5 GHz, the lowest reported; bit-error-rate measurements at 10 GHz were not possible. A high-J/sub c/ process which was used to fabricate the amplifier was developed at UC Berkeley with extremely low I/sub c/ spreads; at /spl sim/9.4 kA/cm/sup 2/ /spl sigma/ as low as 0.6% was observed. At /spl sim/10 kA/cm/sup 2/, the typical junction linear dimensions are 1.5 /spl sim/ 2 /spl mu/m, sizes for which it is not possible-with available tools-to make reliable vias that are smaller than the junction. We use a nonplanarized junction process, where the via for contact of a wiring layer to a junction can be larger than the junction.
Keywords :
aluminium; aluminium compounds; amplifiers; critical current density (superconductivity); niobium; superconducting integrated circuits; 10 GHz; Josephson amplifier; Nb-Al-AlO-Nb; Nb/Al-AlOx/Nb integrated circuit; bit error rate; digital amplifier; superconducting circuit; ultra-small-spread high-J/sub c/ process; voltage-state amplifier; Circuit testing; Current density; Digital integrated circuits; Etching; High speed integrated circuits; Josephson junctions; Laboratories; Niobium; Operational amplifiers; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783717
Filename :
783717
Link To Document :
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