• DocumentCode
    1542473
  • Title

    Design validation of embedded dependable systems

  • Author

    Bondavalli, Andrea ; Fantechi, Alessandro ; Latella, Diego ; Simoncini, Luca

  • Author_Institution
    Univ. of Firenze, Italy
  • Volume
    21
  • Issue
    5
  • fYear
    2001
  • Firstpage
    52
  • Lastpage
    62
  • Abstract
    Many application fields use computer-controlled systems, with different levels of criticality requirements. A common characteristic of such embedded systems is their increasing complexity in intrinsic terms-distribution management, redundancy, functionality layering, and so on-and of their in-the-field operation-environmental interfaces, timing constraints, controlled application criticality, and so on. Designers rarely completely master this increasing complexity. Usual design practices often suffer from-partial approaches, overlooked details, inadequate modeling, insufficient prototyping, and limited design tools or available techniques. With these shortcomings, designs often end up addressing incorrect, incomplete, or misunderstood user requirements often the main cause of a design or systems final failure. Embedded complex systems require an integrated and best-balanced set of components. To use these components, requires some sort of verifiable compositionality, a concept that implies the preservation of properties and the ability to verify them
  • Keywords
    Petri nets; embedded systems; fault tolerant computing; formal verification; specification languages; computer-controlled system; controlled application criticality; criticality requirements; design validation; distribution management; embedded dependable systems; environmental interfaces; functionality layering; redundancy; timing constraints; Application software; Computer industry; Control systems; Embedded system; Formal verification; Object oriented modeling; Process design; Reliability engineering; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/40.958699
  • Filename
    958699