• DocumentCode
    1542484
  • Title

    Fault detection in a tristate system environment

  • Author

    Feng, Wenyi ; Karimi, Farzin ; Lombardi, Fabrizio

  • Volume
    21
  • Issue
    5
  • fYear
    2001
  • Firstpage
    77
  • Lastpage
    85
  • Abstract
    Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size
  • Keywords
    automatic testing; boundary scan testing; circuit CAD; embedded systems; fault diagnosis; integrated circuit testing; interconnections; boundary scan capabilities; comprehensive fault model; embedded computers; fault coverage; fault detection; interconnect; multiple-board systems; test set size; tristate features; tristate system environment; Assembly systems; Digital systems; Embedded computing; Fault detection; Integrated circuit testing; Logic testing; Registers; System testing;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/40.958701
  • Filename
    958701
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1542484