Long term stability of YBCO-based Josephson junctions

Author

Vale, L.R. ; Ono, R.H. ; Talvacchio, J. ; Forrester, M.G. ; Hunt, B.D. ; Dilorio, M.S. ; Yang, K.-Y. ; Yoshizumi, S.

Author_Institution

NIST, Boulder, CO, USA

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

3382

Lastpage

3385

Abstract

We report on a study of long term aging in three different types of YBa/sub 2/Cu/sub 3/O/sub 7-x/ Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and (c) bicrystal junctions which are either unpassivated or passivated in situ with a normal metal shunt or an epitaxial insulator. While all the junctions show degradation, for some the long term survival rate is encouraging.

Keywords

Josephson effect; ageing; barium compounds; high-temperature superconductors; yttrium compounds; Co-doped barrier edge SNS junction; YBCO Josephson junction; YBa/sub 2/Cu/sub 3/O/sub 7/; aging; bicrystal junction; epitaxial insulator; noble metal step edge SNS junction; normal metal shunt; passivation; stability; Aging; Insulation; Josephson junctions; Protection; Sputtering; Stability; Superconducting devices; Superconducting films; Superconducting materials; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783755

Filename

783755