DocumentCode
154255
Title
Analysis of applying time-dependent clustering model to BEOL TDDB
Author
Achanta, Ravi ; Wu, E. ; Baozhen Li ; McLaughlin, Paul
Author_Institution
Microelectron. Div., IBM, Hopewell Jct, VA, USA
fYear
2014
fDate
20-23 May 2014
Firstpage
219
Lastpage
222
Abstract
Recently, a time-dependent clustering model has been reported showing good agreement with multiple sets of experimental TDDB data by proper consideration of the percentile scaling of different areas (vertical translation in the Weibull scale) [1,2]. In this work, we investigate the scaling property (horizontal translation) of time-to-fail (TFAIL) for different areas. Our results indicate that both the horizontal and vertical scaling properties for area transformation are preserved in the clustering model, showing its potential to replace the Weibull model. Moreover, we demonstrate the applicability of the time-dependent clustering model to bi-modal TDDB data, often encountered in practice. Finally, we develop a successive breakdown theory in the framework of the clustering model and compare it with experimental BEOL TDDB data.
Keywords
Weibull distribution; electric breakdown; BEOL TDDB; Weibull model; Weibull scale; area transformation; horizontal scaling properties; horizontal translation; percentile scaling; time-dependent clustering model; time-to-fail; vertical scaling properties; vertical translation; Analytical models; Data models; Dielectric breakdown; Dielectrics; Logic gates; Mathematical model;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
978-1-4799-5016-4
Type
conf
DOI
10.1109/IITC.2014.6831874
Filename
6831874
Link To Document