Growth and properties of NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///PrBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// quasi-homostructures for the fabrication of electronic devices

Author

Alvarez, G.A. ; Wen, J.G. ; Wang, F. ; Utagawa, T. ; Enomoto, Y.

Author_Institution

Supercond. Res. Lab., ISTEC, Tokyo, Japan

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3017

Lastpage

3020

Abstract

We report on well-characterized c-axis quasi-homoepitaxial multilayers made of NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (NBCO) and PrBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (PBCO) films with very smooth surface morphology and high crystallinity, grown on SrTiO/sub 3/ substrates by pulsed laser deposition (PLD). X-ray diffraction (XRD), transmission electron microscopy (RBS) and Rutherford backscattering spectrometry (RBS) analyses provide evidence of long-range crystalline perfection, and a well-equilibrated and relaxed crystal. Furthermore, high quality junctions were fabricated from c-axis-oriented NBCO/PBCO/NBCO multilayers. The current-voltage characteristics (CVC) exhibit supercurrent and quasi-particle tunneling that is commonly observed for superconductor-insulator-superconductor (SIS) junctions. Our results show the importance of using barrier layer materials of PBCO sandwiched between NBCO electrodes for the fabrication of electronic devices.

Keywords

Rutherford backscattering; X-ray diffraction; barium compounds; high-temperature superconductors; neodymium compounds; praseodymium compounds; pulsed laser deposition; superconducting epitaxial layers; superconductive tunnelling; transmission electron microscopy; NBCO/PBCO/NBCO quasi-homoepitaxial multilayer; NdBa/sub 2/Cu/sub 3/O/sub 7/-PrBa/sub 2/Cu/sub 3/O/sub 7/; Rutherford backscattering spectrometry; SrTiO/sub 3/; SrTiO/sub 3/ substrate; X-ray diffraction; barrier layer; current-voltage characteristics; electronic device fabrication; film crystallinity; growth; pulsed laser deposition; quasi-particle tunneling; superconductor-insulator-superconductor junction; surface morphology; transmission electron microscop; Crystallization; Electrons; Nonhomogeneous media; Optical pulses; Pulsed laser deposition; Surface emitting lasers; Surface morphology; X-ray diffraction; X-ray lasers; X-ray scattering;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.621961

Filename

621961