Title :
Spectral characterization of a blue-enhanced silicon photodetector
Author :
Lerch, Michael L F ; Rosenfeld, Anatoly B. ; Simmonds, Phillip E. ; Taylor, Geoffery N. ; Meikle, Steve R. ; Perevertailo, V.L.
Author_Institution :
Centre for Med. Radiat. Phys., Wollongong Univ., NSW, Australia
fDate :
8/1/2001 12:00:00 AM
Abstract :
In this paper, we report on spectral response data and gamma ray spectroscopy measurements using two newly developed silicon photodetectors that are designed to have enhanced sensitivity in the blue spectral region. The enhanced sensitivity is a result of our newly developed ion implantation profile used to create the active area of the photodetector. The quantum efficiency of the new photodetectors (without any optimized antireflective coating) has been measured to be ~40% at a wavelength of 420 nm. Gamma ray spectroscopy experiments have been performed using a thallium doped cesium iodide, [CsI(Tl)], and a cerium doped lutetium oxy-orthosilicate, (LSO) crystal excited by a 137 Cs or 22Na source and read out by the new photodetectors. We have measured an energy resolution of 7.7% and 22.7% full-width at half-maximum (FWHM) for the 662-keV gamma rays from a 137Cs for the CsI(Tl) and LSO scintillator crystal respectively. We intend to use the photodetectors, in the form of a detector array optically coupled to CsI(Tl) or LSO, in the development of a new scintillator detector module for use in positron emission tomography (PET)
Keywords :
gamma-ray detection; gamma-ray spectroscopy; photodetectors; photodiodes; positron emission tomography; silicon radiation detectors; solid scintillation detectors; 420 nm; 662 keV; 137Cs source; 22Na source; CsI(Tl); CsI:Tl; FWHM; LSO; Lu2SiO4O:Ce; PET; Si; Si photodetector; blue spectral region; blue-enhanced; energy resolution; gamma ray spectroscopy; positron emission tomography; quantum efficiency; sensitivity; spectral response; Cerium; Coatings; Energy measurement; Ion implantation; Optical arrays; Photodetectors; Positron emission tomography; Silicon; Spectroscopy; Wavelength measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on