• DocumentCode
    1543079
  • Title

    Properties of HTS step-edge SNS junctions

  • Author

    Golubov, A.A. ; Krasnov, V.M. ; Kupriyanov, M.Yu.

  • Author_Institution
    Inst. of Thin Films & Ion Technol. Res. Center, Julich, Germany
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    3204
  • Lastpage
    3207
  • Abstract
    The critical current and current-voltage characteristics of step-edge HTS SNS junctions are discussed theoretically. In accordance with the experimental data it is assumed that the current transport through both NS interfaces takes place in ab-direction. In the bottom interface ((001) surface of YBCO) the ab-coupling may occur due to atomic steps which play a role of constrictions for the current flow. Therefore the contact is modelled as SNS structure with system of constrictions located at both interfaces. The IcRN product and the excess current Iex are calculated as a function of temperature, interface transparency and N layer thickness. It is shown that in accordance with the experimental data the Iex and Ic are of the same order of magnitude in a broad parameter range.
  • Keywords
    Josephson effect; high-temperature superconductors; HTS step-edge SNS Josephson junction; YBCO; YBaCuO; critical current; current-voltage characteristics; excess current; interface transparency; normal resistance; Atomic layer deposition; Critical current; Electrodes; Gold; High temperature superconductors; Nuclear physics; Solid state circuits; Superconducting films; Transistors; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.622012
  • Filename
    622012