DocumentCode :
1543079
Title :
Properties of HTS step-edge SNS junctions
Author :
Golubov, A.A. ; Krasnov, V.M. ; Kupriyanov, M.Yu.
Author_Institution :
Inst. of Thin Films & Ion Technol. Res. Center, Julich, Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3204
Lastpage :
3207
Abstract :
The critical current and current-voltage characteristics of step-edge HTS SNS junctions are discussed theoretically. In accordance with the experimental data it is assumed that the current transport through both NS interfaces takes place in ab-direction. In the bottom interface ((001) surface of YBCO) the ab-coupling may occur due to atomic steps which play a role of constrictions for the current flow. Therefore the contact is modelled as SNS structure with system of constrictions located at both interfaces. The IcRN product and the excess current Iex are calculated as a function of temperature, interface transparency and N layer thickness. It is shown that in accordance with the experimental data the Iex and Ic are of the same order of magnitude in a broad parameter range.
Keywords :
Josephson effect; high-temperature superconductors; HTS step-edge SNS Josephson junction; YBCO; YBaCuO; critical current; current-voltage characteristics; excess current; interface transparency; normal resistance; Atomic layer deposition; Critical current; Electrodes; Gold; High temperature superconductors; Nuclear physics; Solid state circuits; Superconducting films; Transistors; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622012
Filename :
622012
Link To Document :
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