Critical currents, proximity effect, and Josephson penetration depth in planar high-T/sub c/ Josephson junctions

Author

Tolpygo, S.K. ; Gurvitch, M.

Author_Institution

Dept. of Phys., State Univ. of New York, Stony Brook, NY, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3208

Lastpage

3212

Abstract

We have studied the temperature dependence of the critical current in planar high-T/sub c/ Josephson junctions fabricated in YBa/sub 2/Cu/sub 3/O/sub 7/ thin films by focused electron irradiation. We show that in the range of critical current densities spanning more than five orders of magnitude and temperature range 0.1\n\n\t\t

Keywords

Josephson effect; barium compounds; critical current density (superconductivity); high-temperature superconductors; penetration depth (superconductivity); proximity effect (superconductivity); superconducting thin films; yttrium compounds; Josephson penetration depth; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub 7/ thin film; critical current density; focused electron irradiation; high-T/sub c/ superconductor; magnetic field penetration depth; pairing symmetry; planar Josephson junction; proximity effect; temperature dependence; Critical current; Critical current density; Electrons; Josephson junctions; Magnetic films; Proximity effect; Superconducting thin films; Temperature dependence; Temperature distribution; Transistors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622013

Filename

622013