DocumentCode
1543244
Title
HTS SFQ T-flip flop with directly coupled readout
Author
Sun, A.G. ; Durand, D.J. ; Murduck, J.M. ; Rylov, S.V. ; Forrester, M.G. ; Hunt, B.D. ; Talvacchio, J.
Author_Institution
Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
3825
Lastpage
3828
Abstract
The authors report the design, fabrication, and test results of single flux quantum (SFQ) toggle flip flop circuits. These circuits, investigated as building blocks of an HTS counting ADC, feature a directly coupled readout junction stack similar to those used in LTS RSFQ circuits. The directly coupled circuit delivers higher readout voltage, hence potentially higher operating speed than magnetically coupled alternatives. The circuits were fabricated using two multilayer HTS SNS junction integrated circuit technologies (one at Northrop Grumman and the other at TRW) featuring three YBCO depositions. Initial testing demonstrated toggling of a T-flip flop in response to SFQ pulses generated by integrated dc/SFQ converters. The readout voltage is shown to approach 40% of the junction I/sub C/R/sub N/ product, and as high as 100 /spl mu/V at 65K. Test results are compared with predicted fabrication process parameter requirements. To increase margins and tolerance to process parameter variations, improvements to the design have been made using JSpice and MALT.
Keywords
flip-flops; high-temperature superconductors; readout electronics; superconducting logic circuits; superconductor-normal-superconductor devices; 65 K; JSpice; MALT; SFQ T-flip flop; YBCO deposition; YBaCuO; design; directly coupled readout junction; fabrication; multilayer HTS SNS junction integrated circuit; single flux quantum toggle flip flop; Circuit testing; Coupling circuits; Fabrication; High temperature superconductors; Integrated circuit technology; Magnetic circuits; Magnetic flux; Magnetic multilayers; Voltage; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.783861
Filename
783861
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