Application of a cryogenic vector network measuring technique in a high-speed digital test

Author

Shimaoka, K. ; Nemoto, M. ; Tokunaga, S. ; Yoshida, I. ; Fujimaki, A. ; Hayakawa, H.

Author_Institution

Res. Center, Sanyo Electr. Co. Ltd., Ibaraki, Japan

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

3845

Lastpage

3849

Abstract

The result of a digital transmission test of a YBa/sub 2/Cu/sub 3/Ox/MgO/Au microstrip line to coplanar waveguide transmission line converter is reported. It was fabricated in order to introduce a microwave design technology for high-speed digital testing. The performance was verified using a cryogenic vector network measuring technique. The transmission characteristics of the microstrip line to coplanar waveguide transmission line converter was almost the same as YBa/sub 2/Cu/sub 3/Ox/MgO/Au microstrip line at frequencies from 40 MHz to 10 GHz at 30 K. The bit error rate was analyzed using a 2/sup 23/-1 pseudo random binary signal at 3 GHz. The degradation of the bit error rate caused by the microstrip line to coplanar waveguide transmission line converter and the measuring system itself are discussed using the Q factor of the signal obtained from the bit error rate analysis and the transmission characteristics obtained by the vector network measurement.

Keywords

barium compounds; coplanar waveguides; cryogenics; high-temperature superconductors; integrated circuit measurement; integrated circuit testing; microwave measurement; network analysers; superconducting integrated circuits; superconducting microwave devices; yttrium compounds; 30 K; 40 MHz to 10 GHz; Q factor; YBa/sub 2/Cu/sub 3/O-MgO-Au; bit error rate; bit error rate analysis; cryogenic vector network measuring technique; digital transmission test; high-speed digital test; microstrip line to coplanar waveguide; microwave design technology; pseudo random binary signal; transmission characteristics; transmission line converter; Bit error rate; Coplanar transmission lines; Coplanar waveguides; Cryogenics; Error analysis; Gold; Microstrip; Signal analysis; Testing; Transmission line measurements;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783866

Filename

783866