DocumentCode :
1543413
Title :
Conductivity and microwave response of YBaCuO Josephson junctions on YSZ bicrystal substrate
Author :
Meledin, D.V. ; Lipatov, A.P. ; Verevkin, A.A. ; Ilyin, V.A. ; Serjantov, V.A. ; Naumov, A.A.
Author_Institution :
Moscow State Pedagogical Inst., Russia
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
3929
Lastpage :
3932
Abstract :
We have studied conductivity and microwave response of single YBaCuO Josephson junctions (JJ) and their one-dimensional serial arrays. The I-V characteristics, conductivity, differential resistance and detector response of microwave radiation with frequencies F=134 and 550 GHz were measured in the temperature range from 4.2 to 88 K. Total conductivity of YBaCuO JJ was in general determined by the RSJ model with deviations affected by the influence of localized states forming around a bicrystal boundary. Microwave response of YBaCuO JJ contains two components: the Josephson component that predominates at low bias voltage, and observed at high bias voltage component due to the microwave-induced increase of the probability of inelastic resonant quasiparticle tunneling through several localized states, where response voltage changes its sign.
Keywords :
Josephson effect; high-temperature superconductors; superconducting arrays; superconducting integrated circuits; superconducting microwave devices; superconductive tunnelling; 134 GHz; 4.2 to 88 K; 550 GHz; I-V characteristics; Josephson junctions; YBaCuO; bias voltage; conductivity; detector response; differential resistance; inelastic resonant quasiparticle tunneling; localized states; microwave response; microwave-induced increase; one-dimensional serial arrays; response voltage; Conductivity measurement; Electrical resistance measurement; Frequency; Josephson junctions; Microwave antenna arrays; Microwave measurements; Radiation detectors; Temperature measurement; Voltage; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.783887
Filename :
783887
Link To Document :
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