DocumentCode
1543458
Title
Interaction induced by nonuniform self-fields in stacks of two long Josephson junctions
Author
Carapella, G. ; Costabile, G. ; Pedersen, N.F. ; Sakai, S.
Author_Institution
Dipt. di Fisica, Salerno Univ., Italy
Volume
9
Issue
2
fYear
1999
fDate
6/1/1999 12:00:00 AM
Firstpage
3953
Lastpage
3956
Abstract
We fabricated and tested devices consisting of two long stacked Josephson junctions with direct access to the intermediate electrode, whose thickness is smaller than London penetration depth /spl lambda//sub L/. The electrodes are patterned so that the junctions can be independently biased in the overlap configuration. In the absence of an external magnetic field, we measured the critical current of one junction in the stack as a function of the bias current in the other junction, while the latter was either in the zero voltage state or in the McCumber state. The results indicate that mutual interaction takes place anyway, i.e. when both the junctions or only one of them is in the zero voltage state. To account for the observed phenomena we propose a model that takes into account the nonuniform self-fields generated by the bias currents in this special three-terminal device.
Keywords
Josephson effect; critical current density (superconductivity); penetration depth (superconductivity); superconducting junction devices; London penetration depth; McCumber state; bias current; critical current; intermediate electrode; long Josephson junctions; mutual interaction; nonuniform self-fields; overlap configuration; three-terminal device; zero voltage state; Couplings; Critical current; Electrodes; Josephson junctions; Magnetic devices; Niobium; Physics; Stability; Testing; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.783893
Filename
783893
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