Title :
A Faraday cage isolation structure for substrate crosstalk suppression
Author :
Wu, J.H. ; Scholvin, J. ; del Alamo, J.A. ; Jenkins, K.A.
Author_Institution :
MIT, Cambridge, MA, USA
Abstract :
We have exploited a recently-developed, through-wafer via technology in silicon to implement a novel Faraday cage scheme for substrate crosstalk suppression in system-on-chip (SOC) applications. The Faraday cage structure consists of a ring of grounded vias encircling sensitive or noisy portions of a chip. The via technology features high aspect ratio, through-wafer holes filled with electroplated Cu and lined with a silicon nitride barrier layer. The new Faraday cage structure has shown crosstalk suppression of 40 dB at 1 GHz and 36 dB at 5 GHz at a distance of 100 μm. This is about 10 dB better than any other isolation technique previously reported.
Keywords :
crosstalk; isolation technology; mixed analogue-digital integrated circuits; 1 to 5 GHz; Cu; Faraday cage isolation structure; RF mixed-signal integrated circuit; Si; Si/sub 3/N/sub 4/; electroplated copper; silicon nitride barrier layer; substrate crosstalk suppression; system-on-chip; through-wafer via technology; Acoustical engineering; Circuit noise; Crosstalk; Integrated circuit noise; Integrated circuit technology; Isolation technology; Mixed analog digital integrated circuits; Radio frequency; Silicon; System-on-a-chip;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.959312