• DocumentCode
    1543539
  • Title

    Intermodulation measurements in superconducting meander lines

  • Author

    Shinho Cho ; Cheon Lee

  • Author_Institution
    Semicond. Examination Div. II, Korean Ind. Property Office, Daejon, South Korea
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    3998
  • Lastpage
    4001
  • Abstract
    The intermodulation measurements are used to study the nonlinear effects in high-T/sub c/ microstrip meander lines at microwave frequencies. The superconducting YBa/sub 2/Cu/sub 3/O/sub 7/ (YBaCuO) thin films were grown by laser ablation on both sides of lanthanum alumite substrates and the microstrip pattern was defined using photolithography. The meander line is elicited by two microwave signals from two sweep oscillators at both frequencies of 4.70052 GHz and 4.69952 GHz over temperature range of 19 to 86 K. The measured harmonic signals show a gradual decrease in transmission and disappear as the critical temperature is reached. As for the dependence on the input power the transmission (A) of the third-order harmonic signals at 19 K shows a linear dependence on the input power (P), A(P)=1.30P-61 in the range of 12.5-17.0 dBm.
  • Keywords
    barium compounds; high-temperature superconductors; intermodulation; microstrip lines; superconducting microwave devices; superconducting thin films; yttrium compounds; 19 to 86 K; 4.69952 GHz; 4.70052 GHz; YBa/sub 2/Cu/sub 3/O/sub 7/; YBaCuO thin film; harmonic signal; high-T/sub c/ superconductor; intermodulation; lanthanum alumite substrate; laser ablation; microstrip meander line; nonlinear effect; passive microwave device; photolithography; Frequency measurement; Laser ablation; Masers; Microstrip; Microwave frequencies; Microwave measurements; Superconducting microwave devices; Superconducting thin films; Temperature distribution; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783904
  • Filename
    783904