DocumentCode
1543617
Title
Monte Carlo simulation of impact ionisation in photodetectors
Author
Dunn, G.M. ; Rees, G.J. ; David, J.P.R.
Author_Institution
Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK
Volume
33
Issue
4
fYear
1997
fDate
2/13/1997 12:00:00 AM
Firstpage
337
Lastpage
339
Abstract
The authors have studied impact ionisation in optical detectors using a self-consistent Monte Carlo method. Current multiplication was found to be sensitive to both the applied potential and the incident light intensity. The amount of current multiplication was significantly higher than might be expected from a naive interpretation of the nominally applied field and this was attributed to screening effects within the device. The potential within the device was also significantly affected by the impact ionisation process and this in turn gave rise to an interesting structure (oscillations) in the current at higher incident light intensities and potentials
Keywords
Monte Carlo methods; electric breakdown; impact ionisation; photodetectors; semiconductor device models; Monte Carlo simulation; applied potential; current multiplication; impact ionisation; incident light intensity; optical detectors; photodetectors; screening effects;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19970191
Filename
583512
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