Spatial investigation of transverse mode turn-on dynamics in VCSELs

Author

Mahmoud, S. W S ; Wiedenmann, D. ; Kicherer, M. ; Unold, H. ; Jäger, R. ; Michalzik, R. ; Ebeling, K.J.

Author_Institution

Dept. of Optoelectron., Ulm Univ., Germany

Volume

13

Issue

11

fYear

2001

Firstpage

1152

Lastpage

1154

Abstract

Data transmission experiments with single-mode as well as multimode 850-nm vertical-cavity surface-emitting lasers (VCSELs) are carried out from a near-field point of view. Special attention is paid to important quantities like on/off-ratio and bit error rate (BER). A single-mode VCSEL oscillating on the fundamental LP/sub 01/ mode shows no change in eye opening, on/off-ratio, and BER at different lateral fiber coupling positions. In the case of a multimode VCSEL oscillating both on the LP/sub 01/ mode and LP/sub 11/ donut mode, we observe a significant lateral change in the on/off-ratio, which plays an important role in BER measurements.

Keywords

infrared sources; laser modes; laser transitions; semiconductor lasers; surface emitting lasers; 850 nm; BER measurements; LP/sub 01/ mode; LP/sub 11/ donut mode; VCSELs; bit error rate; data transmission experiments; eye opening; fundamental LP/sub 01/ mode; lateral fiber coupling positions; multimode VCSEL; multimode vertical-cavity surface-emitting lasers; on/off-ratio; single-mode VCSEL oscillation; transverse mode turn-on dynamics; Bit error rate; Fiber lasers; Laser modes; Optical fiber communication; Optical fiber devices; Semiconductor lasers; Solids; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.959347

Filename

959347