• DocumentCode
    1543676
  • Title

    Enhanced output power in an InGaN-GaN multiquantum-well light-emitting diode with an InGaN current-spreading layer

  • Author

    Sheu, J.K. ; Chi, G.C. ; Jou, M.J.

  • Author_Institution
    Opt. Sci. Center, Nat. Central Univ., Chung-Li, Taiwan
  • Volume
    13
  • Issue
    11
  • fYear
    2001
  • Firstpage
    1164
  • Lastpage
    1166
  • Abstract
    InGaN-GaN multiple quantum-well (MQW) light-emitting diodes (LEDs) with InGaN current-spreading layer were grown by metal-organic vapor-phase epitaxy (MOVPE) and their characteristics were evaluated by current-voltage (I-V), as well as output power measurements. Experimental results indicate that the LEDs exhibited a higher output power and a lower operation voltage than that of conventional LEDs. The external quantum efficiency of InGaN-GaN MQW LEDs for bare chips operated at injection current of 20 mA with InGaN current spreading layer near 5%. This is two times higher than that of conventional LEDs. This could be tentatively attributed to the better current-spreading effect resulting from Si-doped In/sub 0.18/Ga/sub 0.82/N wide potential well in which electron states are not quantized.
  • Keywords
    III-V semiconductors; MOCVD; gallium compounds; indium compounds; light emitting diodes; semiconductor quantum wells; vapour phase epitaxial growth; 5 percent; In/sub 0.18/Ga/sub 0.82/N:Si; In/sub 0.18/Ga/sub 0.82/N:Si wide potential well; InGaN current spreading layer; InGaN current-spreading layer; InGaN-GaN; InGaN-GaN MQW LEDs; InGaN-GaN multiquantum-well light-emitting diode; MOVPE; Si-doped In/sub 0.18/Ga/sub 0.82/N wide potential well; bare chips; current-voltage; electron states; enhanced output power; external quantum efficiency; injection current; lower operation voltage; metal-organic vapor-phase epitaxy; output power measurements; Current measurement; Epitaxial growth; Epitaxial layers; Light emitting diodes; Potential well; Power generation; Power measurement; Quantum well devices; Semiconductor device measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.959351
  • Filename
    959351