DocumentCode :
1543704
Title :
Low-temperature scanning electron microscopy for low noise studies of high-T/sub c/ superconductors
Author :
Gerber, R. ; Nissel, T. ; Wener, H.-G. ; Willmann, A. ; Keil, S. ; Hansel, H. ; Huebener, R.P. ; Koelle, D. ; Gross, R.
Author_Institution :
Phys. Inst., Tubingen Univ., Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3231
Lastpage :
3234
Abstract :
Low-Temperature Scanning Electron Microscopy (LTSEM) has been successfully applied to the investigation of the local superconducting properties of thin films and Josephson junctions as well as to the study of more complex superconducting circuits. Since many superconducting devices and circuits can be operated successfully only in low ambient magnetic fields, we have built a liquid nitrogen cooled low temperature stage with improved magnetic shielding for the temperature range between 77 and 130 K. For effective magnetic shielding we use a superconducting YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// tube in addition to several Mumetall shields. We established further improvements such as an in-vacuum motorized x-y-slide, which allows us to shift the sample with a minimum step width of 1.5 /spl mu/m. We present first test measurements of the transport properties of a high T/sub c/ dc SQUID that demonstrate the functionality of the new stage.
Keywords :
Josephson effect; SQUIDs; barium compounds; high-temperature superconductors; low-temperature techniques; magnetic shielding; scanning electron microscopy; superconducting device noise; superconducting device testing; superconducting thin films; yttrium compounds; 77 to 130 K; Josephson junctions; Mumetall shields; YBa/sub 2/Cu/sub 3/O/sub 7/; cryostat; dc SQUID; high-T/sub c/ superconductors; in-vacuum motorized x-y-slide; liquid N/sub 2/ cooled low temperature stage; local superconducting properties; low noise studies; low-temperature scanning electron microscopy; magnetic shielding; superconducting YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// tube; superconducting circuits; test measurements; thin films; transport properties; Circuit noise; Josephson junctions; Magnetic noise; Magnetic shielding; Scanning electron microscopy; Superconducting device noise; Superconducting devices; Superconducting thin films; Temperature distribution; Thin film circuits;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622036
Filename :
622036
Link To Document :
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