• DocumentCode
    1543736
  • Title

    1 volt DC programmable Josephson voltage standard

  • Author

    Burroughs, C.J. ; Bent, S.P. ; Harvey, T.E. ; Hamilton, C.A.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    4145
  • Lastpage
    4149
  • Abstract
    NIST has developed a programmable Josephson voltage standard (JVS) that produces intrinsically stable voltages that are programmable from -1.1 V to +1.1 V. The rapid settling time (1 /spl mu/s), large operating current margins (2 to 4 mA), and inherent step stability of this new system make it superior to a conventional JVS for many dc measurements. This improved performance is made possible by a new integrated-circuit technology using intrinsically shunted superconductor-normal-superconductor (SNS) Josephson junctions. These junctions operate at lower excitation frequencies (10 to 20 GHz) than a conventional JVS and have 100 times greater noise immunity. The Josephson chip consists of a binary array sequence of 32 768 SNS Josephson junctions. The chip has been integrated into a completely automated system that is finding application in mechanical/electrical watt-balance experiments, evaluation of thermal voltage converters, electron-counting capacitance standards, and metrology triangle experiments.
  • Keywords
    Josephson effect; measurement standards; programmable circuits; superconducting arrays; superconducting integrated circuits; superconductor-normal-superconductor devices; voltage measurement; 1 V; DC metrology; DC programmable Josephson voltage standard; Josephson chip; SNS Josephson junction; automated system; binary array; integrated circuit technology; Current measurement; Josephson junctions; Measurement standards; NIST; Semiconductor device measurement; Stability; Standards development; Superconducting device noise; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783938
  • Filename
    783938