• DocumentCode
    1543801
  • Title

    Ten-fold tunability of the permittivity of Ba/sub 1-x/Sr/sub x/TiO/sub 3/ in epitaxial multilayers with (Y/Nd)Ba/sub 2/Cu/sub 3/O/sub 7-/spl delta//

  • Author

    Boikov, Yu.A. ; Ivanov, Z.G. ; Claeson, T.

  • Author_Institution
    Dept. of Phys. & Eng. Phys., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    4193
  • Lastpage
    4196
  • Abstract
    Dielectric properties of 400-600 nm thick epitaxial layers of SrTiO/sub 3/ and Ba/sub 0.9/Sr/sub 0.1/TiO/sub 3/, inserted between YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// or NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// electrodes, were investigated as functions of temperature and electric field. The electric field response of the dielectric permittivity of the ferroelectric layer correlated with the Curie point and was considerably higher with Nd based than with Y based superconducting electrodes. Insertion of thin buffer layers improved the tunability and decreased the microwave losses of the Ba doped dielectric.
  • Keywords
    barium compounds; ferroelectric Curie temperature; ferroelectric thin films; high-temperature superconductors; multilayers; neodymium compounds; permittivity; strontium compounds; superconducting epitaxial layers; yttrium compounds; Ba/sub 0.9/Sr/sub 0.1/TiO/sub 3/; Ba/sub 1-x/Sr/sub x/TiO/sub 3/; Curie point; NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; NdBa/sub 2/Cu/sub 3/O/sub 7/; SrTiO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/; buffer layer; dielectric properties; electric field response; epitaxial multilayer; ferroelectric layer; microwave loss; permittivity; superconducting electrode; tunability; Dielectric losses; Electrodes; Epitaxial layers; Ferroelectric materials; Neodymium; Permittivity; Strontium; Superconducting epitaxial layers; Superconducting microwave devices; Temperature;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783949
  • Filename
    783949