• DocumentCode
    1543913
  • Title

    Low noise LTS SQUIDs for application in gravitational experiments

  • Author

    Vodel, W. ; Koch, H. ; Nietzsche, S. ; Zameck Glyscinski, J.V. ; Dittus, H. ; Lochmann, S. ; Mehls, C.

  • Author_Institution
    Inst. fur Festkorperphys., Friedrich-Schiller-Univ., Jena, Germany
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    3343
  • Lastpage
    3346
  • Abstract
    The Weak Principle of Equivalence (WEP) is proved up to now with an accuracy of 1/spl times/10/sup -12/. Short range free fall experiments attained an accuracy of 5/spl times/10/sup -10/ only. Microgravity facilities such as the "Drop Tower Bremen" enables long range free fall experiments which may improve the accuracy of free fall tests to <10/sup -12/ using high performance SQUID measuring technique. In this review the application of LTS DC SQUIDs with Nb-NbO/sub x/-Pb/In/Au window-type Josephson junctions for gravitational experiments is described. Under optimal conditions a noise limited sensitivity of 1.4/spl times/10/sup -12/ m//spl radic/(Hz) for the position detector was achieved corresponding to a flux noise of the SQUID system of 2/spl times/10/sup -6/ /spl Phi//sub 0///spl radic/(Hz). The contribution gives the design of the DC SQUID position detector and summarizes recent results of its application in gravitational experiments.
  • Keywords
    SQUIDs; gravitational experiments; superconducting device noise; zero gravity experiments; Drop Tower Bremen; LTS DC SQUID; Nb-NbO-Pb-In-Au; Nb-NbO/sub x/-Pb/In/Au window-type Josephson junction; flux noise; free fall; gravitational experiment; measurement technique; microgravity facility; position detector; sensitivity; weak principle of equivalence; Delay effects; Detectors; Displacement measurement; Gravity; Performance evaluation; Poles and towers; SQUIDs; Superconducting coils; Testing; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.622082
  • Filename
    622082