• DocumentCode
    1543921
  • Title

    Design investigation of 1D-arrays of metallic single electron tunneling transistors

  • Author

    Knoll, M. ; Uhlmann, F.H.

  • Author_Institution
    Tech. Hochschule Ilmenau, Germany
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    4265
  • Lastpage
    4268
  • Abstract
    Starting from the geometry and material constants we calculate the capacitances in metallic single charge tunneling structures using a 3D numerical field computation tool based on the boundary element method. This is exemplified by means of a step-edge cut-off tunnel junction geometry. Beginning with a single junction we further investigate multi-junction single electron transistors and, for the first time, arrays of them. Beside this calculation of the intercapacitance matrix we quantitatively analyze the influence of parasitic background charges. In view of its performance our tool could establish the basis for the evaluation of more complex layouts in single charge electronics.
  • Keywords
    boundary-elements methods; capacitance; single electron transistors; superconducting arrays; superconducting transistors; superconductive tunnelling; 1D array; 3D field; boundary element method; capacitance; design; intercapacitance matrix; metallic single electron tunneling transistor; multi-junction SET; numerical simulation; parasitic background charge; single charge electronics; step-edge cut-off tunnel junction; Boundary element methods; Capacitance; Character generation; Circuits; Computed tomography; Geometry; Insulation; Metal-insulator structures; Single electron transistors; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783967
  • Filename
    783967