DocumentCode
1544073
Title
A 16 MHz BW 75 dB DR CT
ADC Compensated for More Than One Cycle Excess Loop Delay
Author
Singh, Vikas ; Krishnapura, Nagendra ; Pavan, Shanthi ; Vigraham, Baradwaj ; Behera, Debasish ; Nigania, Nimit
Author_Institution
Texas Instrum., Bangalore, India
Volume
47
Issue
8
fYear
2012
Firstpage
1884
Lastpage
1895
Abstract
The maximum sampling rate of a continuous-time ΔΣ modulator in a given process is limited by the minimum flash ADC delay that can be realized. Excess loop delay compensation techniques that are widely used can compensate for delays up to half a clock cycle. Addition of a fast loop outside the flash ADC can break this limit and compensate for one and half clock cycles of delay at the cost of reducing the order of noise shaping by one. This technique, along with a low latency flash ADC, and a delay free calibrated DAC, result in a lowpass continuous-time ΔΣ ADC with the highest reported sampling rate in a 0.18 m process. The prototype occupies 0.68 mm2 , consumes 47.6 mW, and operates at 800 MS/s. In a 16 MHz bandwidth (oversampling ratio of 25), the dynamic range, maximum signal to noise ratio, and maximum signal to noise and distortion ratios are 75 dB, 67 dB, and 65 dB respectively. In a 32 MHz bandwidth, the dynamic range, maximum signal to noise ratio, and maximum signal to noise and distortion ratios are 64 dB, 57 dB, and 57 dB, respectively.
Keywords
analogue-digital conversion; calibration; clocks; cost reduction; delay circuits; delta-sigma modulation; DR CT ΔΣ ADC compensation technique; bandwidth 16 MHz; bandwidth 32 MHz; continuous-time ΔΣ modulator; cost reduction; delay free calibrated DAC; distortion ratio; half clock cycle; minimum flash ADC delay; noise figure 57 dB; noise figure 64 dB; noise figure 65 dB; noise figure 67 dB; noise figure 75 dB; noise shaping reduction; one cycle excess loop delay; power 47.6 mW; sampling rate; signal to noise ratio; size 0.18 m; Ash; Delay; Feedforward neural networks; Modulation; Noise; Quantization; Transfer functions; Analog-to-digital converter (ADC); compensation; continuous-time; delta-sigma; excess loop delay (ELD); oversampling; quantizer; sample and hold (S/H);
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2012.2196730
Filename
6220855
Link To Document