Title :
Self-organizing feature maps and hidden Markov models for machine-tool monitoring
Author :
Owsley, Lane M D ; Atlas, Les E. ; Bernard, Gary D.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fDate :
11/1/1997 12:00:00 AM
Abstract :
Vibrations produced by the use of industrial machine tools can contain valuable information about the state of wear of tool cutting edges. However, extracting this information automatically is quite difficult. It has been observed that certain structures present in the vibration patterns are correlated with dullness. We present an approach to extracting features present in these structures using self-organizing feature maps (SOFMs). We have modified the SOFM algorithm in order to improve its generalization abilities and to allow it to better serve as a preprocessor for a hidden Markov model (HMM) classifier. We also discuss the challenge of determining which classes exist in the machining application and introduce an algorithm for automatic clustering of time-sequence patterns using the HMM. We show the success of this algorithm in finding clusters that are beneficial to the machine-monitoring application
Keywords :
acoustic signal processing; feature extraction; hidden Markov models; machine tools; pattern classification; self-organising feature maps; sequences; signal representation; time-frequency analysis; transient analysis; vibrations; wear; HMM classifier; acoustic signal classification; automatic clustering; cutting edges; dullness; feature extraction; hidden Markov models; industrial machine tools; machine tool monitoring; machining application; modified SOFM algorithm; preprocessor; self-organizing feature maps; time-frequency representations; time-sequence patterns; vibration patterns; wear; wideband transient events; Clustering algorithms; Condition monitoring; Data mining; Feature extraction; Hidden Markov models; Machine tools; Machining; Manufacturing processes; Refining; Signal processing algorithms;
Journal_Title :
Signal Processing, IEEE Transactions on