Title :
Integrated high-transition temperature SQUID-based voltmeters operated at 77 K
Author :
Yang, H.C. ; Chen, J.H. ; Horng, H.E. ; Yang, S.Y. ; Jeng, J.T.
Author_Institution :
Dept. of Phys., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
6/1/1999 12:00:00 AM
Abstract :
The voltage noise levels of high-T/sub c/ based YBa/sub 2/Cu/sub 3/O/sub 7/ bicrystal SQUIDs and SQUID voltmeters were measured to investigate their noise characteristics. The SQUIDs are of washer type with outer dimension of 90 /spl mu/m/spl times/90 /spl mu/m and inner dimension of 20 /spl mu/m/spl times/20 /spl mu/m. The SQUIDs have a normal inductance of about 60 pH. The integrated modulation and input coils were circular in shape. The modulation coil has a radius of r/sub 2/=80 /spl mu/m and r/sub 1/=60 /spl mu/m while the input coil for voltage measurement has radius r/sub 2/=50 /spl mu/m and r/sub 1/=30 /spl mu/m. Using a dc bins and standard flux locked loop, the spectral density of the voltage noise, S/sub v/, was observed to behave as 1/f at low frequencies and the root mean square flux noise, S/sub /spl Phi///sup 1/2/, is white and has a value of /spl sim/15 /spl mu//spl Phi//sub 0//Hz/sup 1/2/ at 1 kHz. The flux noise levels were reduced to /spl sim/4 /spl mu//spl Phi//sub 0//Hz/sup 1/2/ using the ac bias reversing technique. These data suggest that the dominant 1/f voltage noise was caused by critical current fluctuations. We further demonstrate that the 1/f can be induced by flux motion. The voltage noise levels of the SQUID voltmeters are also reported.
Keywords :
1/f noise; SQUIDs; barium compounds; bicrystals; high-temperature superconductors; superconducting device noise; voltmeters; yttrium compounds; 1/f voltage noise; 77 K; SQUID voltmeter; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub 7/ bicrystal; critical current fluctuations; flux motion; high-T/sub c/ superconductor; voltage measurement; Coils; Inductance; Low-frequency noise; Noise level; Noise measurement; Noise shaping; SQUIDs; Temperature; Voltage; Voltmeters;
Journal_Title :
Applied Superconductivity, IEEE Transactions on