DocumentCode :
1544175
Title :
Universal active dc biasing system for a high-T/sub c/ SQUID based on a liquid-nitrogen-cooled preamplifier
Author :
Ukhausky, N.N. ; Dorrer, L. ; Schmidl, F. ; Seidel, P.
Author_Institution :
Inst. of Terrestrial Magnetism, Ionosphere & Radiowave Propagation, Acad. of Sci., Troitsk, Russia
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
4416
Lastpage :
4419
Abstract :
A system for the SQUID active dc biasing was developed and tested. This system provides an opportunity to change the output resistance of the biasing source over a wide range. The white flux-noise of a bicrystal SQUID-gradiometer has been measured in direct readout scheme with three different values of the biasing source output resistance. A maximum level of white noise of 11 /spl mu//spl Phi//sub 0//Hz/sup 1/2/@100 kHz was found in case of maximum output resistance (current-biasing). A white noise of 7,9 /spl mu//spl Phi//sub 0/Hz/sup 1/2/ was measured for the minimum of the biasing source resistance (voltage-biasing). The best level of the flux noise of 6 /spl mu//spl Phi//sub 0//Hz/sup 1/2/ was found at a biasing source resistance close to SQUID normal resistance R/sub n/ (power-biasing). Significant reduction of the cut-off frequency (near 10 kHz instead of 100 kHz) was found for the tested bicrystal SQUID-gradiometers due to the active dc voltage-and power-biasing systems in comparison with the standard current-biasing circuit.
Keywords :
SQUID magnetometers; bicrystals; high-temperature superconductors; preamplifiers; superconducting device noise; white noise; active DC bias; bicrystal SQUID gradiometer; cut-off frequency; direct readout; high-T/sub c/ superconductor; liquid-nitrogen-cooled preamplifier; white flux noise; Active noise reduction; Circuit testing; High temperature superconductors; Noise level; Preamplifiers; SQUID magnetometers; Superconducting device noise; System testing; Voltage; White noise;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784004
Filename :
784004
Link To Document :
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