DocumentCode :
1544181
Title :
Imaging Properties of Scintillation Screens for High Energetic Ion Beams
Author :
Renuka, Krishnakumar ; Becker, Frank ; Ensinger, Wolfgang ; Forck, Peter ; Haseitl, Rainer ; Walasek-Höhne, Beata
Volume :
59
Issue :
5
fYear :
2012
Firstpage :
2301
Lastpage :
2306
Abstract :
The imaging properties of various scintillation screens were investigated for ion beams extracted from the heavy ion synchrotron SIS 18 at GSI. Different ion beams such as C, Ne, Ar, Ta and U with initial kinetic energy of about 300 MeV/u were applied to various scintillation screens with particle fluxes ranging from 104 to 109 particles per pulse typically within 0.3 s pulse length. The scintillation process was observed with a digital Charge Coupled Device (CCD) camera. The performed study compares the light output, the beam profiles, and the image deformation of various scintillating screens for different ion beams. The light output scales linearly with respect to the ion beam flux over five orders of magnitude for the sensitive scintillation screens and ceramics like Al2 O3 , Al2 O3:Cr. The highest light output was observed for CsI:Tl, and the lowest was recorded for Herasil. At higher beam intensities, non linear behavior of light output was observed for Mg and Y doped ZrO2 samples. The recorded beam profiles showed differences in width up to 50%, depending on the screen material.
Keywords :
CCD image sensors; aluminium compounds; caesium compounds; chromium; ion beams; magnesium; particle beam diagnostics; particle beam dynamics; particle beam extraction; quartz; solid scintillation detectors; thallium; yttrium; zirconium compounds; Al2O3; Al2O3:Cr; CsI:Tl; GSI; Herasil; SiO2; ZrO2:Mg; ZrO2:Y; ceramics; digital charge coupled device camera; heavy ion synchrotron; high energetic ion beams; image deformation; ion beam Ωux; ion beam extraction; ion beam intensities; kinetic energy; light nonlinear behavior; scintillation process; scintillation screen imaging properties; Atmospheric measurements; Charge coupled devices; Crystals; Ion beams; Particle measurements; Ion irradiation; ion beam profile; particle beam instrumentation; scintillation devices; scintillation light yield; transverse profile;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2197417
Filename :
6220881
Link To Document :
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