DocumentCode :
1544201
Title :
Improvement of high T/sub c/ SQUID performance using an integrated resistor
Author :
Tarte, E.J. ; Kang, D.J. ; Booij, W.E. ; Coleman, P.D. ; Moya, A. ; Baudenbacher, F. ; Moon, S.H. ; Blamire, M.G.
Author_Institution :
Interdisciplinary Res. Centre in Supercond., Cambridge Univ., UK
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
4432
Lastpage :
4435
Abstract :
The performance of high T/sub c/ SQUIDs with resistively shunted inductances have been investigated. We find that the voltage modulation depth /spl Delta/V of shunted 83 pH SQUIDs is significantly larger than that of unshunted SQUIDs with similar parameters and increases with the parameter /spl gamma/=R/sub n//R/sub s/ as expected from theory (R/sub n/ is the junction resistance and R/sub s/ the shunt resistance). We also find that the conventional decrease of /spl Delta/V with SQUID inductance L can be eliminated leaving only the effect of the thermal noise flux. In this way /spl Delta/V=63 /spl mu/V has been achieved for a bicrystal SQUID at 77 K whose screening parameter /spl beta//sub L/=13. Noise measurements performed on this SQUID indicate that the resistor in circuit does not increase the noise.
Keywords :
SQUIDs; bicrystals; high-temperature superconductors; superconducting device noise; thermal noise; bicrystal SQUID; high T/sub c/ superconductor; integrated resistor; junction resistance; resistively shunted inductance; screening parameter; shunt resistance; thermal noise flux; voltage modulation depth; Annealing; Critical current; Electron beams; Inductance; Magnetic modulators; Noise measurement; Resistors; SQUIDs; Strips; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784008
Filename :
784008
Link To Document :
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