DocumentCode
1544351
Title
Inhomogeneous response of superconducting tunnel junctions with a killed electrode for X-ray spectroscopy
Author
van den Berg, M.L. ; Bruijn, M.P. ; Gomez, J. ; Kiewiet, F.B. ; de Korte, P.A.J. ; van Lieshout, H.L. ; Luiten, O.J. ; Martin, J. ; Le Grand, J.B. ; Schroeder, T. ; Huebener, R.P.
Author_Institution
Netherlands Space Res. Organ., Utrecht, Netherlands
Volume
7
Issue
2
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
3363
Lastpage
3366
Abstract
Nb-based superconducting tunnel junctions are being developed as high energy resolution X-ray detectors. Unfortunately, loss of excess quasiparticles at the edges, combined with lateral diffusion, results in an inhomogeneous response. To study this degradation of energy resolution, we manufactured detectors with a Ta trap in the top or bottom electrode away from the tunneling barrier. Excess quasiparticles in this so-called killed electrode will be trapped effectively and thus removed from the tunneling process. The X-ray spectra of the active electrode can be fitted with a model based on classical diffusion of quasiparticles. On junctions with a killed bottom electrode also Low Temperature Scanning Electron Microscopy (LTSEM) measurements have been performed. The X-ray spectra and the LTSEM scans are consistent with each other and with the model. The energy resolution of the junctions presented here is limited by loss of quasiparticles at the edges.
Keywords
X-ray detection; X-ray spectrometers; electrodes; niobium; quasiparticles; scanning electron microscopy; superconducting device noise; superconducting device testing; superconducting junction devices; superconducting particle detectors; LTSEM scans; Low Temperature Scanning Electron Microscopy; Nb; Nb-based superconducting tunnel junctions; Ta trap; Ta-Nb-Al-AlO-Al-Nb-Ta; X-ray spectra; X-ray spectroscopy; active electrode; bottom electrode; energy resolution degradation; excess quasiparticle loss; excess quasiparticles; high energy resolution X-ray detectors; inhomogeneous response; killed electrode; lateral diffusion; quasiparticle classical diffusion; top electrode; tunneling barrier; Degradation; Electrodes; Electron traps; Energy resolution; Josephson junctions; Manufacturing; Scanning electron microscopy; Temperature; Tunneling; X-ray detectors;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.622092
Filename
622092
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