Title :
Proximity effect and hot-electron diffusion in Ag/Al/sub 2/O/sub 3//Al tunnel junctions
Author :
Netel, H. ; Jochum, J. ; Labov, S.E. ; Mears, C.A. ; Frank, M. ; Chow, D. ; Lindeman, M.A. ; Hiller, L.J.
Author_Institution :
Phys. & Space Technol. Directorate, Lawrence Livermore Nat. Lab., CA, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We have fabricated Ag/Al/sub 2/O/sub 3//Al tunnel junctions on Si substrates using a new process. This process was developed to fabricate superconducting tunnel junctions (STJs) on the surface of a superconductor. These junctions allow us to study the proximity effect of a superconducting Al film on a normal metal trapping layer. In addition, these devices allow us to measure the hot-electron diffusion constant using a single junction. Lastly these devices will help us optimize the design and fabrication of tunnel junctions on the surface of high-Z, ultra-pure superconducting crystals.
Keywords :
Josephson effect; X-ray detection; alumina; aluminium; hot carriers; proximity effect (superconductivity); silver; superconducting device testing; superconducting junction devices; superconducting particle detectors; Ag-Al/sub 2/O/sub 3/-Al; Ag/Al/sub 2/O/sub 3//Al tunnel junctions; Si; Si substrates; cryogenic X-ray detection; high-Z ultra-pure superconducting crystal surface; hot-electron diffusion; normal metal trapping layer; proximity effect; superconducting tunnel junctions; tunnel junction fabrication; Artificial intelligence; Extraterrestrial measurements; Fabrication; Geophysical measurements; Josephson junctions; Photonic crystals; Proximity effect; Superconducting devices; Superconducting epitaxial layers; Superconducting films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
