Title :
Single photon imaging X-ray spectrometers using low noise current preamplifiers with dc voltage bias
Author :
Friedrich, S. ; Segall, K. ; Gaidis, M.C. ; Wilson, C.M. ; Prober, D.E. ; Kindlmann, P.J. ; Szymkowiak, A.E. ; Moseley, S.H.
Author_Institution :
Dept. of Appl. Phys., Yale Univ., New Haven, CT, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We have developed superconducting single-photon imaging X-ray detectors with an energy resolution of 54 eV at 6 keV and a spatial resolution of 1 /spl mu/m over an effective length of 40 /spl mu/m. They utilize a current-sensitive low-noise preamplifier with a dc voltage bias. It has a signal bandwidth of 300 kHz, current noise of i/sub n/=0.26 pA//spl radic/(Hz) and voltage noise of e/sub n/=0.5 nV//spl radic/(Hz) with an input capacitance of 200 pF under operating conditions. Injected pulses with a charge Q=3.7/spl middot/10/sup 6/ electrons have been measured with a standard deviation /spl sigma/Q=3400 electrons, corresponding to an electronic noise of 13 eV at 6 keV.
Keywords :
X-ray detection; X-ray spectrometers; circuit noise; preamplifiers; superconducting device noise; superconducting device testing; superconducting particle detectors; superconductor-insulator-superconductor devices; 200 pF; 300 kHz; 40 mum; 6 keV; Al-AlO-Al; Al-AlO/sub x/-Al; SIS tunnel junctions; current noise; current-sensitive low-noise preamplifier; dc voltage bias; effective length; electronic noise; energy resolution; injected pulse measurement; input capacitance; low noise current preamplifiers; signal bandwidth; single photon imaging X-ray spectrometers; spatial resolution; voltage noise; Electrons; Energy resolution; Optical imaging; Pulse measurements; Spatial resolution; Spectroscopy; Superconducting device noise; Voltage; X-ray detectors; X-ray imaging;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
