DocumentCode :
1544506
Title :
The future of bipolar power transistors
Author :
Huang, Alex Q. ; Zhang, Bo
Author_Institution :
Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
48
Issue :
11
fYear :
2001
fDate :
11/1/2001 12:00:00 AM
Firstpage :
2535
Lastpage :
2543
Abstract :
Silicon based bipolar power transistor (BPT) as a switching power transistor has been replaced by other superior power devices in the past two decades. This transformation is primarily due to the poor performance of the BPT. Among many problems of the BPT, low current gain and small safe operation area (SOA) caused by the second breakdown have been most detrimental to silicon BPT´s fate. However, BPT performance based on newer materials, such as wide bandgap semiconductors, has not been previously studied. This paper systematically compares the BPTs based on wide bandgap semiconductor materials. Device figures-of-merit for conduction and switching losses are proposed. Comparison of the BPT based on total power loss is then provided. Based on this work, it is concluded that BPTs based on wide bandgap materials overcome the critical disadvantages of silicon BPTs, and are capable of switching power operation at several hundred kilohertz frequencies at very high current densities and voltages. Therefore, BPTs based on wide bandgap materials are still very attractive switching power devices for the future
Keywords :
power bipolar transistors; power semiconductor switches; wide band gap semiconductors; bipolar power transistor; conduction loss; current gain; figure of merit; power loss; safe operation area; second breakdown; switching loss; switching power device; wide bandgap semiconductor; Conducting materials; Electric breakdown; Photonic band gap; Power semiconductor switches; Power transistors; Semiconductor materials; Semiconductor optical amplifiers; Silicon; Switching loss; Wide band gap semiconductors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.960379
Filename :
960379
Link To Document :
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