DocumentCode :
1544520
Title :
The early history of IBM´s SiGe mixed signal technology
Author :
Harame, David L. ; Meyerson, Bernard S.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Volume :
48
Issue :
11
fYear :
2001
fDate :
11/1/2001 12:00:00 AM
Firstpage :
2555
Lastpage :
2567
Abstract :
The history of Silicon Germanium (SiGe) at IBM is a story of persistence. The program began with an idea to replace a conventional implantation step, used in every silicon semiconductor bipolar process, by growing an in-situ doped alloy (SiGe). Many people thought the idea was of value only for a few exotic niche “research” applications. This is a story about how a small group of people persuaded a large digital computer manufacturer to invest in a new unproven technology for telecommunication applications in a field which the company knew little about. It is a success story, as SiGe technology has now become the only BiCMOS technology in development in IBM and is in the roadmaps of every major telecommunication company
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; heterojunction bipolar transistors; mixed analogue-digital integrated circuits; semiconductor materials; BiCMOS mixed-signal technology; IBM; SiGe; SiGe heterojunction bipolar transistor; silicon-germanium alloy; Application software; BiCMOS integrated circuits; Boron; Computer aided manufacturing; Germanium silicon alloys; Heterojunction bipolar transistors; History; Implants; Silicon germanium; Surface resistance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.960383
Filename :
960383
Link To Document :
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