DocumentCode :
1544661
Title :
Project fist: Fault isolation by semiautomatic techniques: Part II — Detailed instrumentation
Author :
Shapiro, Gustave ; Rogers, George J. ; Laug, Owen B. ; Fulcomer, P.Michael
Author_Institution :
National Bureau of Standards
Volume :
1
Issue :
9
fYear :
1964
Firstpage :
130
Lastpage :
144
Abstract :
This second and final part of the article discusses the details of the FIST test instrument, examines the configurations of some typical transformation networks, and describes the stimulus generators, which are used to furnish the test signal when the normal signal input to a module is inadequate for test purposes The method for fault isolation by semiautomatic techniques developed at the National Bureau of Standards, to which the acronym FIST has been applied, is a diagnostic tool for rapidly isolating faults in a modularized, noncomputer type of electronic equipment without removal of the modules from the prime equipment. It seeks to reduce the down time required for maintenance by combining modularized equipment, which minimizes the time and skill required to restore system operation, with a rapid, simple method for isolating defective modules. Although it has been devised to permit the novice technician to check module performance without being required to interpret data, it can also be used by the skilled technician to isolate a malfunctioning module rapidly, without reference to technical manuals and without prior knowledge of the equipment being tested.
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1964.6501142
Filename :
6501142
Link To Document :
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