DocumentCode :
1544828
Title :
When every atom counts
Author :
Miranda, Miguel
Volume :
49
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
32
Lastpage :
32
Abstract :
Today´s chips are marvels of mass production. Tens of thousands of silicon wafers can move through a single fab in a month, each one carted from tool to tool, blasted by heat, bombarded by ions, immersed in vapor, coated with chemicals, hit with radiation, and exposed to acid. It can take months and hundreds of steps to transform a plain piece of silicon into an array of chips. But at the end of this elaborate assembly line, chipmakers finally get a pile of identical devices that perform just as their designers intended.
Keywords :
Integrated circuit modeling; Random access memory; Semiconductor process modeling; Silicon; Transistors; Wafer scale integration;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.2012.6221080
Filename :
6221080
Link To Document :
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