DocumentCode :
1544860
Title :
Detailed investigation of two-dimensional Josephson junction array circuits
Author :
Keek, M. ; Doderer, T. ; Mueller, R. ; Pfeifer, R. ; Laub, A. ; Huebener, R.P. ; Traeuble, T. ; Dolata, R. ; Weimann, T. ; Niemeyer, J.
Author_Institution :
Lehrstuhl fur Experimentalphys. II, Tubingen Univ., Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
3407
Lastpage :
3410
Abstract :
We have investigated two-dimensional arrays of overdamped Josephson junctions that have been fabricated in Nb/Al/sub 2/O/sub 3//Nb-technology, together with microwave coupling structures. Different arrays have shown to emit coherent microwave radiation by using microwave-coupled on-chip detectors. Low-temperature scanning electron microscopy is used to study the coupling of the microwave radiation to an on-chip load. From the appearance of Shapiro steps in the current vs. voltage curves of detector junctions for different degrees of disorder in the array-junctions, margins of the spread in the critical currents of the Josephson junctions for coherent oscillation can be drawn.
Keywords :
alumina; coupled circuits; critical currents; microwave oscillators; millimetre wave oscillators; niobium; phase locked oscillators; scanning electron microscopy; superconducting device testing; superconducting microwave devices; superconductor-insulator-superconductor devices; 4.2 K; Nb-Al/sub 2/O/sub 3/-Nb; Nb/Al/sub 2/O/sub 3//Nb-technology; Shapiro steps; array-junction disorder; coherent microwave radiation emission; coherent oscillation; critical current spread; current voltage curves; low-temperature scanning electron microscopy; microwave coupling structures; microwave-coupled on-chip detectors; overdamped Josephson junctions; phase locking; two-dimensional Josephson junction array circuits; Circuits; Critical current; Detectors; Insulation; Josephson junctions; Microwave antenna arrays; Niobium; Resistors; Sensor arrays; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.622110
Filename :
622110
Link To Document :
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