• DocumentCode
    1544929
  • Title

    Highly accurate and simple models for CML and ECL gates

  • Author

    Alioto, M. ; Palumbo, G.

  • Author_Institution
    Dipt. di Elettrico, Elettronico e Sistemistco, Catania Univ., Italy
  • Volume
    18
  • Issue
    9
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    1369
  • Lastpage
    1375
  • Abstract
    In this paper simple and accurate models for the propagation delay of both current mode logic (CML) and emitter-coupled logic (ECL) gates are proposed. The models start from the small signal model properly evaluated. This makes it possible to represent propagation delay with a few terms, providing a better insight into the relationship between delay and its electrical parameters, which in turn are related to process parameters. The main difference between accurate and simple models is that the former need few Spice simulations to properly evaluate the model parameters. In order to validate the models, a comparison using both a traditional and a high-speed bipolar process was carried out under many bias conditions and output loads. Simple models have typical errors of around 20%. Accurate models have typical errors as low as 2% and 5% for CML and ECL, respectively, while the worst case error is as low as 5% and 8% for CML and ECL, respectively
  • Keywords
    bipolar logic circuits; circuit simulation; current-mode logic; delay estimation; emitter-coupled logic; high-speed integrated circuits; integrated circuit modelling; CML gates; ECL gates; bias conditions; current mode logic; emitter-coupled logic; high-speed bipolar process; output loads; process parameters; propagation delay; small signal model; Bipolar transistor circuits; Delay estimation; Digital integrated circuits; High speed integrated circuits; Integrated circuit modeling; Load modeling; Logic circuits; Logic gates; Propagation delay; Sensitivity analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.784127
  • Filename
    784127