Investigation of the signal resolution of a high-T/sub c/ balanced comparator

Author

Oelze, B. ; Ruck, B. ; Sodtke, E. ; Filippov, T. ; Kidiyarova-Shevchenko, A. ; Kupriyanov, M. ; Prusseit, W.

Author_Institution

Inst. fur Schicht- und Ionentechnik, Forschungszentrum Julich GmbH, Germany

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3450

Lastpage

3453

Abstract

The use of high-T/sub c/ Josephson junctions for digital applications requires a careful study of the influence of thermal noise on circuit performance. We investigated a balanced current comparator, which contains a basic component of all RSFQ circuits: two overdamped Josephson junctions connected in series. The dependence of the dc-voltage across the Josephson junctions on signal current was measured to determine the threshold uncertainty of switching of the comparator. The experimental data obtained at different sampling pulse frequencies, in a temperature range from 10 to 50 K, were compared with a theoretical model, taking into account the influence of thermal noise as well as of sampling pulse frequency.

Keywords

Josephson effect; comparators (circuits); high-temperature superconductors; signal resolution; superconducting device noise; superconducting logic circuits; thermal noise; 10 to 50 K; RSFQ circuit; balanced current comparator; digital applications; high-T/sub c/ superconductor; overdamped Josephson junction; sampling pulse frequency; signal resolution; thermal noise; Circuit noise; Critical current; Frequency; Josephson junctions; Pulse circuits; Pulse generation; Sampling methods; Signal resolution; Superconducting device noise; Temperature distribution;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622129

Filename

622129